AWG710B 1 ch


4.2 GS/s Sample Rate Simulates Real-world Signals Up To 2.1 GHz 2 Markers With 2.0 psRMS (@ 4.2GS/s, Typical) Jitter Deliver stable Timing to the Device-under-test (DUT) 32.4M (32,400,000) or 64.8M (64,800,000) Point Record Length Provide Longer Data Streams Analog Bandwidth to 2 GHz (Option 02, Calculated Based on Rise Time) Provides the Highest Signal Fidelity of All High-speed AWGs Direct External clock input allows Jittered and non-jittered signals for high-speed data stream timing margin test up to 4.2Gb/s Synchronous operation mode supports two AWG710B outputs (2:
analog, 4:
marker) synchronization for high data rate wireless and data communication test and optical write channel strategy signal test. Waveform Quick Editor with 300 fs Edge Timing Resolution Delivers Output Edge Control with Near Real-time Precision Allows two-signal mix function digitally to support disk drive noise performance test and Pre/De-emphasis serial data communication test Real-time Sequencing Creates Infinite Waveform Loops, Jumps, Patterns and Conditional Branches


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